王雪 1,*刘乃鑫 1,2王兵 1,2郭亚楠 1,2[ ... ]李晋闽 1,2
作者单位
摘要
1 山西中科潞安紫外光电科技有限公司,山西 长治 046000
2 中国科学院半导体研究所 半导体照明技术研究开发中心,北京 100083
在p?AlGaN表面沉积Ni/Au/Ni/Au透明电极体系,通过传输线模型测试,研究了退火温度对Ni/Au/Ni/Au与p?AlGaN材料接触特性的影响。结果表明,AlGaN基深紫外LED采用Ni/Au/Ni/Au金属体系,在600 ℃空气氛围下退火3 min形成p型半导体材料NiO。进一步优化Ni/Au/Ni/Au体系金属厚度,当Ni/Au/Ni/Au各层厚度由20/20/20/20 nm减薄至2/2/5/5 nm,并在600 ℃空气氛围退火3 min,其与p?AlGaN材料的接触电阻率从3.23×10-1 Ω·cm2降到2.58×10-4 Ω·cm2。采用上述优化的Ni/Au/Ni/Au体系制备的深紫外LED器件,器件光电特性得到了改善。在150 mA驱动下工作电压低至5.8 V;通过提升电极透过率,光输出功率提升18.9%。
UV-LED AlGaN NiAu 欧姆接触 UV-LED AlGaN, NiAu Ohmic contact 
发光学报
2023, 44(5): 898
作者单位
摘要
北京中科优唯科技有限公司,北京 100083
针对由激光隐形切割技术导致的蓝宝石衬底侧壁粗化对GaN基发光二极管(LED)倒装芯片光提取效率(LEE)的影响,提出一种蒙特卡罗光线追踪的方法。使用蒙特卡罗光线追踪法具体分析侧壁隐形切割对LED倒装芯片各出光面LEE的影响,并对LED倒装芯片蓝宝石侧壁隐形切割的层数和位置进行优化设计。仿真结果表明,随着蓝宝石侧壁隐形切割层数的增多,以及蓝宝石侧壁等效粗糙度的提升,LED倒装芯片顶部出光面的LEE缓慢减少,而侧壁和LED倒装芯片总的LEE逐渐增加。采用蒙特卡罗光线追踪法模拟均匀激光打点与组合激光打点对LED倒装芯片LEE的影响。实验结果表明,当隐形切割层数固定时,均匀激光打点的侧壁和总的LEE均高于组合激光打点。
光学器件 发光二极管 激光隐切 侧壁粗化 光提取效率 
激光与光电子学进展
2021, 58(7): 0723001
李晋闽 1,2,3,*刘志强 1,2,3魏同波 1,2,3闫建昌 1,2,3[ ... ]王军喜 1,2,3
作者单位
摘要
1 中国科学院半导体研究所照明研发中心, 北京 100083
2 中国科学院大学, 北京 100049
3 北京第三代半导体材料与应用工程技术研究中心, 北京 100083
半导体照明是21世纪初兴起的产业,也是我国第三代半导体材料成功产业化的第一个突破口,技术发展日新月异,是国际高科技领域竞争的焦点之一。目前,我国半导体照明产业已经形成了完整的产业链,功率白光LED、硅基LED和全光谱LED等核心技术同步国际,紫外LED、可见光通讯、农业光照和光医疗等创新应用走在世界前列。介绍了我国在半导体照明方面的研究进展,回顾了相关产业的发展情况,并对未来进行了展望。
材料 半导体照明 发光二极管 氮化物 深紫外LED 
光学学报
2021, 41(1): 0116002
Wen Gu 1,2Zhibin Liu 1,2,3Yanan Guo 1,2,3Xiaodong Wang 1,2,3[ ... ]Jianchang Yan 1,2,3
Author Affiliations
Abstract
1 Research and Development Center for Solid-State Lighting, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
3 Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
4 Advanced Ultraviolet Optoelectronics Co. Ltd, Changzhi 046000, China
5 Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
6 Youwill Hitech Co. Ltd, Beijing 100083, China
High-quality AlN/sapphire templates were fabricated by the combination of sputtering and high-temperature (HT) annealing. The influence of sputtering parameters including nitrogen flux, radio frequency power, and substrate temperature on the crystalline quality and surface morphology of annealed AlN films were investigated. With lower substrate temperature, lower power, and lower N2 flux, the full width at half maximum of the X-ray rocking curve for AlN (0002) and (10 2) were improved to 97.2 and 259.2 arcsec after high-temperature annealing. This happens because the increased vacancy concentration of sputtered AlN films can facilitate the annihilation of dislocations by increasing the recovery rate during HT annealing. Step and step-bunching morphologies were clearly observed with optimized sputtering conditions.
Journal of Semiconductors
2020, 41(12): 122802
Author Affiliations
Abstract
1 State Key Laboratory of High Performance Complex Manufacturing, College of Mechanical and Electrical Engineering, Central South University, Changsha 410083, China
2 Semiconductor Lighting Technology Research and Development Center, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
3 College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China
4 State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
5 e-mail: liancheng_wang@csu.edu.cn
6 e-mail: spring@semi.ac.cn
To achieve high quality lighting and visible light communication (VLC) simultaneously, GaN based white light emitting diodes (WLEDs) oriented for lighting in VLC has attracted great interest. However, the overall bandwidth of conventional phosphor converted WLEDs is limited by the long lifetime of phosphor, the slow Stokes transfer process, the resistance-capacitance (RC) time delay, and the quantum-confined Stark effect (QCSE). Here by adopting a self-assembled InGaN quantum dots (QDs) structure, we have fabricated phosphor-free single chip WLEDs with tunable correlated color temperature (CCT, from 1600 K to 6000 K), a broadband spectrum, a moderate color rendering index (CRI) of 75, and a significantly improved modulation bandwidth (maximum of 150 MHz) at a low current density of 72 A/cm2. The broadband spectrum and high modulation bandwidth are ascribed to the capture of carriers by different localized states of InGaN QDs with alleviative QCSE as compared to the traditional InGaN/GaN quantum well (QW) structures. We believe the approach reported in this work will find its potential application in GaN WLEDs and advance the development of semiconductor lighting-communication integration.
Photonics Research
2020, 8(7): 07001110
Zhuohui Wu 1,2,3,4Jianchang Yan 1,2,3,4Yanan Guo 1,2,3,4Liang Zhang 1,2,3,4[ ... ]Jinmin Li 1,2,3,4
Author Affiliations
Abstract
1 Research and Development Center for Solid State Lighting, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
3 Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
4 State Key Laboratory of Solid-State Lighting, Beijing 100083, China
This study focused on the evolution of growth front about AlN growth on nano-patterned sapphire substrate by metal-organic chemical vapor deposition. The substrate with concave cones was fabricated by nano-imprint lithography and wet etching. Two samples with different epitaxy procedures were fabricated, manifesting as two-dimensional growth mode and three-dimensional growth mode, respectively. The results showed that growth temperature deeply influenced the growth modes and thus played a critical role in the coalescence of AlN. At a relatively high temperature, the AlN epilayer was progressively coalescence and the growth mode was two-dimensional. In this case, we found that the inclined semi-polar facets arising in the process of coalescence were type. But when decreasing the temperature, the semi-polar facets arose, leading to inverse pyramid morphology and obtaining the three-dimensional growth mode. The 3D inverse pyramid AlN structure could be used for realizing 3D semi-polar UV-LED or facet-controlled epitaxial lateral overgrowth of AlN.
Journal of Semiconductors
2019, 40(12): 122803
Author Affiliations
Abstract
1 Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
2 Peking University, Beijing, 100871, China
3 Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China
4 Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
Journal of Semiconductors
2019, 40(12): 120101
Xuejiao Sun 1,2Zhiguo Yu 1Ning Zhang 1,2Lei Liu 1,2[ ... ]Yun Zhang 1,2
Author Affiliations
Abstract
1 Semiconductor Lighting Research and Development Center, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
2 College of Materials Sciences and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China
Metallic nanotextured reflectors have been widely used in light emitting diodes (LEDs) to enhance the light extraction efficiency. However, the light absorption loss for the metallic reflectors with nanotexture structure is often neglected. Here, the influence of absorption loss of metallic nanotextured reflectors on the LED optoelectronic properties were studied. Two commonly used metal reflectors Ag and Al were applied to green GaN-based LEDs. By applying a Ag nanotextured reflector, the light output power of the LEDs was enhanced by 78% due to the improved light extraction. For an Al nanotextured reflector, however, only a 6% enhancement of the light output power was achieved. By analyzing the metal absorption using finite-difference time-domain (FDTD) and the metal reflectivity spectrum, it is shown that the surface plasmon (SP) intrinsic absorption of metallic reflectors with nanotexture structure play an important role. This finding will aid the design of the high-performance metal nanotextured reflectors and optoelectronics devices.
Journal of Semiconductors
2019, 40(3): 032301
Liang Zhang 1,2Yanan Guo 1,2,3,4Jianchang Yan 1,2,3,4,6,*Qingqing Wu 1,2[ ... ]Jinmin Li 1,2,3,4
Author Affiliations
Abstract
1 Research and Development Center for Solid State Lighting, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
3 Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
4 State Key Laboratory of Solid-State Lighting, Beijing 100083, China
5 e-mail: jxwang@semi.ac.cn
6 e-mail: yanjc@semi.ac.cn
The nanorod structure is an alternative scheme to develop high-efficiency deep ultraviolet light-emitting diodes (DUV LEDs). In this paper, we first report the electrically injected 274-nm AlGaN nanorod array DUV LEDs fabricated by the nanosphere lithography and dry-etching technique. Nanorod DUV LED devices with good electrical properties are successfully realized. Compared to planar DUV LEDs, nanorod DUV LEDs present >2.5 times improvement in light output power and external quantum efficiency. The internal quantum efficiency of nanorod LEDs increases by 1.2 times due to the transformation of carriers from the exciton to the free electron–hole, possibly driven by the interface state effect of the nanorod sidewall surface. In addition, the nanorod array significantly facilitates photons escaping from the interior of LEDs along the vertical direction, contributing to improving light extraction efficiency. The three-dimensional finite-different time-domain simulation is performed to further analyze in detail the TE- and TM-polarized photons extraction mechanisms of the nanostructure. Our results demonstrate the nanorod structure is a good candidate for high-efficiency DUV emitters.
Photonics Research
2019, 7(9): 09000B66
Author Affiliations
Abstract
We present a near diffraction-limited 1 064-nm Nd:YAG rod laser with output power of 82.3W(M2 \approx 1.38). The power fluctuation over two hours is better than \pm 1.1%. Pulsed 1 064-nm laser with an average power of 66.6 W and pulse width of 46 ns are achieved when the laser is Q-switched at a repetition rate of 10 kHz. The short pulse duration stems from the short cavity as well as the high-gain laser modules. Using intracavity-frequency-doubling, a 35.0-W near diffraction-limited 532-nm green laser (M2 \approx 1.32) is achieved with a pulse width of 43 ns.
140.0140 Lasers and laser optics 140.3580 Lasers, solid-state 140.3410 Laser resonators 140.3515 Lasers, frequency doubled 
Chinese Optics Letters
2012, 10(7): 071401

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